Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection

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Customization: Available
After-sales Service: Life Time Technical Support
Warranty: 1 Year
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  • Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
  • Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
  • Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
  • Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
  • Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
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  • Overview
  • Products Description
  • Product Parameters
  • ABOUT US
  • FAQ
Overview

Basic Info.

Model NO.
BD-0655T
Magnification
6X-55X(Max 330X)
Type
Stereo Microscope
Number of Cylinder
≥Three
Mobility
Desktop
Stereoscopic Effect
Stereoscopic Effect
Kind of Light Source
LED
Shape
Compound
Usage
Teaching, Research, Industry
Principle
Optics
Principle of Optics
Stereo Microscope
Theory
Stereo Microscope
Application
Industry Inspection
Viewing Head
Trinocular Head Inclined
Eyepiece
10X/20X/30X
Lens
0.6X-5.5X
Auxiliary Lens
0.37X/0.5X/0.7X/1.5X/2X
Working Distance
108mm(Max 275mm)
Illumination
LED Illumination
Camera
Optional
Dimension
283X292X385mm
Material
Metal, Optic Glass, Plastic
Customized Support
OEM
Transport Package
Carton
Specification
39x35x40cm, 5kg
Trademark
Boshida
Origin
China
HS Code
9011100000
Production Capacity
500PC Per Month

Packaging & Delivery

Package Size
39.00cm * 35.00cm * 40.00cm
Package Gross Weight
5.000kg

Product Description

Products Description

Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection

 
 
Product Parameters

 

Model

 BD-0655T Stereo Microscope

Optical system

Greenough optical system .

Observation Method

Bright field.

Magnification

Standard: 6X-55X

With optional accessories can be 3.35-300x.

View head

Binocular or Trinocular view head,  35°tilt tube, 360°rotatable.

IPD(Interpupillary distance): 52-76mm.

Eyepeice

Wide field Eyepiece WF10X/23mm, with diopter adjustment: ±6 Diopter. 
Optional: 15X, 20X, 30X

Illumination

Reflected illumination(Top light): LED ring light. Intensity adjustable.
Optional: Transmited illumination(Bottom light).

Zoom lens

Achromatic lens, 0.6X-5.5X continously zoom. 

Zoom ratio: 9.1:1

Auxiliary Lens(Optional) Optional: 0.37X, 0.5X, 0.7X, 1.5X, 2X

View field

38.3~4.1mm

Working distance

108 mm (standard) .
Max 275mm with auxiliary lens.

Camera adapter

0.5X or 1X C-mount.

Stage plate

Glass stage plate, diameter 95mm.

Optional parts

HDMI Digital camera. 

Axuiliary Lens.

Optional Eyepeice.

Boom arm stand

Power supply

AC100-240V, 50/60Hz.




Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection

 
 

 

 
 
ABOUT US
Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
Boshida Bd-0655t 6X-55X (Max 330X) Trinocular Stereo Microscope for Semiconductor Inspection
 
FAQ
Q1
How can you do sample testing?
A1
We can suggest microscope according to applications of user. We had thousands of sucessful cases.If user is not sure of the microscope image quality, user can send us samples for testing. We will send pictures to user. If user is not satisfited with it,don't need to buy it.

Q2
What kind of customization you can supply?
A2
Our microscope have standard version and optional parts. User can choose configuration according to requirement and budget.For Industry using, there are varity of requirements. We can supply/produce microscopes and correct solutions according to requirements.
 

 

 

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